LeTID Testing Method and Procedures for c-Si Photovoltaic (PV) Modules
Light and elevated temperature induced degradation (LeTID) has gained intense interest in the PV community as it can cause severe degradation of modules with multi-crystalline silicon (mc-Si) solar cells and passivated emitter and rear cells (PERC). Using the LeTID test method in the IEC draft, significant degradation of up to 6% can be detected after 600 hours of laboratory testing and the degradation is yet not stabilized. As it is time-consuming, a way to speed up the process for characterization the degradation should be developed.
The LeTID test method developed by TÜV Rheinland, 2 PfG 2689/04.19, is based on IEC 61215 series with modifications of test procedures to evaluate the effect of stress under a combination of high irradiance, carrier injection and elevated temperature on performance.
In this webinar, our expert, Dr. Christos Monokroussos, will explain our test methods and discuss the latest results of our research. We will explain in details how we adjust current injection and how to evaluate the degradation trend with dark voltage monitoring.
Time:
Apr. 02,2020 16:00-17:00 (Beijing)
10:00-11:00 (CEST)
Speaker:
Technical Expert, Director of the competence center for R&D
TÜV Rheinland
Christos's activities in TÜV Rheinland focus on R&D in the
fields of characterization of solar cells and PV-modules, quality
control of measurement systems, standardization progress
and PV-module reliability. Christos earned his doctorate degree
in photovoltaics in the Centre of Renewable Energy Systems
Technology (CREST), Loughborough University, UK.
